Camere CCD per rilevazione diretta (<20 keV)

Camere Serie iKon SO e Newton SO da Andor Technology

La Andor Technolgy offre una vasta gamma di camere CCD per applicazioni di Imaging e di Spettroscopia in presenza di radiazione elettromagnetica ad alta energia. Nel range da 10 eV a 20 KeV, le CCD in Silicio possono essere impiegate in applicazioni con rilevamento diretto, cioè con sensore esposto direttamente alla radiazione VUV, EUV e soft X-ray. Caratterizzate da un efficiente sistema di raffreddamento termoelettrico ed eccellenti linearità ed omogeneità che assicurano l’affidabilità dei dati acquisiti, le camere per rilevazione diretta di Andor Technology si basano su sensori CCD back-illuminated, privi di coating AR e senza impiego di array di microlenti, e sono in grado di rilevare segnali estremamente deboli anche su lunghi tempi di esposizione.

Features
Sensori CCD Back-Illuminated senza coating AR
Pixel size di 13 µm, 13.5 µm 15 µm e 26 µm
Sistema di raffreddamento termoelettrico con temperatura minima raggiungibile di -100°C (dark current trascurabile)
Convertitore A/D a 16- e 18-bit bit ad alte prestazioni con basso readout noise
Ampia gamma di flange per la compatibilità meccanica con qualsiasi camera da vuoto

La Andor Technolgy offre camere CCD compatibili con le condizioni di vuoto in vari formati del sensore. L’interfaccia “O”, “Open Front”, permette l’installazione esterna della CCD su una porta della camera da vuoto per applicazioni X-ray o EUV a rilevazione diretta offrendo la massima sensibilità e la massima risoluzione. Tale design permette alle CCD Andor di poter sfruttare sia il sistema di raffreddamento ad aria che ad acqua e di far uso di un filter holder rimovibile.

Le camere Serie Newton SO e Serie iKon SO sono fornite con flangia meccanica di tipo CF come standard ma sono disponibili molte altre soluzioni, anche rotabili, per consentire l’interfaccia meccanica con qualsiasi porta della camera da vuoto.

La camere Andor per applicazioni X-ray sono di comune impiego in moltissimi Centri di Ricerca per la Fisica delle alte energia in tutto il mondo.

High harmonic generation
Soft X-rays
Spettroscopia VUV e EUV
Radiazione di Sincrotrone

Tomografia X-ray

X-ray tomography
TitleAuthor(s)InstituteYearSpectrograph/
Detector
Soft x-ray microscopy using a table-top laser-induced plasma source based on a pulsed gas jetM. Müller,
K. Mann
Laser-Laboratorium Göttingen e.V.,
Optics / Short Wavelengths
2017iKon-L SO DO936N-OW-BN
A new compact soft X-ray spectrometer for RIXS studies at PETRA IIIZ. Yin1,2,
S. Techert1,2,3
1 FS-SCS, Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany
2 Structural Dynamics of (Bio)chemical Systems, Max Planck Institute for Biophysical Chemistry, Göttingen, Germany
3 Institute of X-ray Physics, Georg-August University, Göttingen, Germany
2017 iKon-L DO936N-OZ-BN
Investigation of spin dynamics in Ni-Pd alloys
using extreme ultraviolet radiation
S. Gang,
R. Adam,
M. Plötzing,
C. M. Schneider
Peter Grünberg Institut (PGI-6), Forschungszentrum Jülich GmbH, JARA, Jülich, Germany2016Newton SO DO920P-BEN
Tabletop coherent diffractive imaging with a gas-discharge extreme ultraviolet light sourceL. Juschkin1,2,
J. Bußmann1,2,
L. Loetgering1,
D. Rudolf1,2, S. Brose3,
S. Danylyuk3,
R. Xu4,
J. Miao4
1Experimental Physics of EUV, RWTH Aachen University, JARA-FIT, Aachen, Germany
2Peter Grünberg Institut (PGI-9), Forschungszentrum Jülich GmbH, JARA-FIT, Jülich, Germany
3Chair for Technology of Optical Systems, RWTH Aachen University, JARA-FIT, Aachen, Germany
4Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, USA
2014iKon-M SO DO934P-BN
Small angle scattering using XUV light from high-order harmonic generationCh. Weier,
R. Adam,
C. M. Schneider
Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany2014Newton SO DO920P-BN
Lensless coherence diffraction imaging with an ultra- narrowband laser-based extreme-ultraviolet sourceS. Witte,
V. T. Tenner,
D. W. E. Noom,
K. S. E. Eikema
Institute for Lasers, Life and Biophotonics (LaserLaB), VU University Amsterdam, The Netherlands2014iKon-M SO DO934P-BN
Coherent X-ray scattering experiments at the coherence beamline P10 at PETRA IIIL. Müller,
F. Westermeier,
M. Sprung
Coherent X-Ray Scattering, DESY, Hamburg, Germany2013iKon-L SO DO936N-MW-BR-DD
Quantitative X-Ray phase imaging of impact damaged carbon-fiber-reinforced polymersM. Hildebrand, M. Leck,
M. Korth
Department of Analytical Measurement Technology, University of Applied Sciences and Arts, Göttingen, Germany2013iKon-M SO DO934P-BR-DD
Spatial characterization of a discharge based radiationK. Bergmann,
J. Vieker
Fraunhofer Institute for Laser Technology, Aachen, Germany
2013
iKon-M SO DO934P-BN
Compact soft x-ray spectrometer for laser-matter studiesR. IrsigInstitute of Physics, University of Rostock, Germany2012
Newton SO DO940P-BN
Warm dense matter analysisP. Neumayer,
D. Hochhaus et al.

GSI, Darmstadt, Germany

2012

iKon-M SO DO934P-BN
DX420-BN
XUV Interferometry using thin-film beam splitters
U. Zastrau1,
V. Hilbert1,
M. Wünsche1,
S. Zhang1,
C. Rödel1,2,
E. Förster 2
1Institute of Optics and Quantum Electronics, University of Jena, Germany
2Helmholtz Institute Jena, Germany

2012
iKon-L SO DO936N-MZ-BN
Element-selective ultrafast magnetization dynamicsD. Rudolf1,
Chan La-O-Vorakiat2,
E. Turgut2,
P. Grychtol1,4,
R. Adam1,
S. Mathias4,
J. M. Shaw3,
H. T. Nembach3,
T. J. Silva 3,
M. Aeschlimann4,
C. M. Schneider1,
M. M. Murnane2,
H. C. Kapteyn2
1Peter Grünberg Institute (PGI-6), Forschungszentrum Jülich, Germany
2Department of Physics and JILA, University of Colorado, Boulder, USA
3Electromagnetics Division, National Institute of Standards and Technology, Boulder, USA
4University of Kaiserslautern and Research Center OPTIMAS, Kaiserslautern, Germany

2012
iKon-L SO DO936N-MW-BN
Time-resolved resonant soft x-ray scattering
with free-electron lasers
W. Schlotter1,
F. Sorgenfrei2,
M. Beye3,
W. Wurth2
1Stanford Linear Accelerator Center, Menlo Park, USA
2Institute for Experimental Physics and Center for Free-Electron Laser Science, University of Hamburg, Germany
3  Helmholtz Centre for Materials and Energy, Berlin, Germany
2011iKon-L SO DO936N-MW-BN
Table-top coherent x-ray-source from mid-infrared high power laser interaction with gasesT. Popmintchev1,
M.-C. Chen1,
D. Popmintchev1,
S. Ališauskas2,
G. Andriukaitis2,
T. Balčiūnas2,
A. Pugžlys2,
A. Baltuška2,
M. Murnane1,
H. Kapteyn1
1  JILA, University of Colorado, Boulder, USA
2  Photonics Institute, Vienna University of Technology, Austria
2011
Newton SO DO920N-BN

Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates
M. Ibek,
T. Leitner,
P. Wernet,
A. Firsov,
A. Erko
Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany
2011
iKon-L SO DO936N-MW-BN
Sample analysis with a grazing incidence XUV reflectometerS. Brose,
M. Banyay,
L. Juschkin,
S. Danylyuk

Chair for the Technology of Optical Systems, RWTH Aachen, Germany
2011DX440-BN2
Single event spectroscopy on laser generated x-ray beams
C. Kern,
M. Schnell,
C. Spielmann
Institute of Optics and Quantum Electronics, University of Jena, Germany2010iKon-L SO DO936N-MW-BN
Interferometry in the XUV spectral range using laser- generated high-order harmonicsD. Hemmers,
G. Pretzler
Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe,  and Institute of Applied Physical Chemistry, University of Heidelberg, Germany2010iKon-L SO DO936N-MW-BN
Coherent microscopy with soft X-raysR. Heine,
A. Rosenhahn
Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe,  and Institute of Applied Physical Chemistry, University of Heidelberg, Germany
2010
DODX436-BN2

Spectral and spatial characterization of harmonics in the XUV region

S. Eyring,
C. Kern,
J. Lohbreier,
R. Spitzenpfeil,
C. Spielmann

Institute of Optics and Quantum Electronics, University of Jena, Germany
2009
DO420-BN1

A calibrated compact soft X-Ray spectrometer
H. Stiel,
H. Legall
Max Born Institute of Nonlinear Optics and Ultrafast Spectroscopy, Berlin, Germany2009iDus SO DO420A-BN3
Time resolved X-Ray diffractionI. UschmannInstitute of Optics and Quantumelectronics, University of Jena, Germany2007DX420-BR-DD2

Laserartige  XUV-Strahlung:
Charakterisierung und Handhabung von Gasharmonischen
A. Klein,
D. Hemmers,
G. Pretzler
Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany2006DO420-BN1

Remarks:
1
DO420 replaced by Newton SO 920
2
not available any more
3
iDus SO replaced by Newton SO

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