Economic high precision table top ellipsometer Alpha-SE

From Woollam Co.

Spectroscopic ellipsometer Alpha-SE is a fast, low-cost system for measuring film thickness and optical constants. Everything is contained in an amazingly small package. It is the ideal table top tool. It is computer controlled through an USB port.

Features
Ex-situ
Rotating compensator ellipsometer
Small and compact
Affordable
Semi-automated

For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds.

Spectral range: 380 nm to 900 nm (180 wavelengths)

Angle of incidence: 65°, 70° and 75°, as well as straight-through

Computer connection: USB (1.1 or higher)

Automated sample height adjustment

Data acquisition time:

  • 3 sec. (Fast mode)
  • 10 sec. (Standard mode)
  • 30 sec. (Long mode)

Options:

  • liquid cell
  • adapter for QCM-D
  • focusing
  • transmission holder
  • translation stage
  • camera
Optical constants and thickness, anisotropy, index gradient, composition

The Alpha-SE is a very accurate and easy-to-use system to determine optical constants, thickness, index gradient, composition, etc.

Dielectric films

With fast measurement speed and push-button operation, the Alpha-SE is ideal for qualifying thin films. Single-layer dielectrics on silicon or glass substrates can be measured in seconds. Log results for easy-to-use comparisons in both graphical and tabular formats.

Self-assembled monolayers

Phase information of a spectroscopic ellipsometry measurement is highly sensitive to very thin films (<10 nm). Self-assembled monolayers can be assessed and quickly compared using the Alpha-SE.

Absorbing films

Coating on glass

Contacts

Request further information
Technical Director & Product Manager
+39 06 5004204
Fax: +39 06 5010389

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