AFM for optical microscopes and 3D profilometers

LensAFM from Nanosurf

The Nanosurf LensAFM is an atomic force microscope that can be used as a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.

Features
Mountable on virtually any optical microscope or 3D optical profilometer
Equipped with a quality objective lens for a clear view of your sample and the AFM cantilever
Integrated motor for automated cantilever approach. Just bring your sample into optical focus and let the LensAFM do the rest.
Large AFM Z-range allows measurement of high structures
All standard AFM modes available through the modular C3000 controller
Roughness measurements
Defect analysis
Sharp edge radius
Step heights
Material properties:
  • hardness variations
  • conductance/resistance
  • magnetism
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