Atomic force microscopes for research

Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can be investigated by analyzing tip-sample interaction forces. We offer AFMs suitable for research in materials science, polymers, electrochemistry, and other applications in nano-science and engineering.

access is a micro-Raman single-spot analysis and mapping microscope. It was specifically engineered for budget-conscious customers with high demands on instrument performance. Its outstanding spectral quality, optical throughput and signal sensitivity are ensured by well-established WITec optical elements.

The high-quality microscope setup of the access is also the basis for its full upgradability. Whenever needed, access can be easily and quickly adapted to new requirements. Customized solutions for e.g. scan stages, spectrometers, cameras and lasers can be added and even advanced Raman techniques can be integrated.

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The Nanosurf LensAFM is an atomic force microscope that can be used as a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.

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The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place. A low-cost AFM solution for any budget!

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The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures. Simple handling and a multitude of integration possibilities bring your product analyses to a whole new level. Check coatings for intended structures or irregularities, or use additional AFM measurement modes to detect features not visible in topography alone. Its ease of use and reproducibility make the NaniteAFM the perfect quality control tool for precision engineering, production process optimization, or semiconductor fabrication — just to name a few.

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By advancing key technologies and system designs, Nanosurf has made the FlexAFM the most versatile and flexible research atomic force microscope ever, allowing a large variety of applications to be performed easily. Whether you want to operate the FlexAFM in air or in liquid environments, in materials science or life science applications, in standard imaging or advanced research modes, on a dedicated sample stage or on an inverted microscope, it makes no difference to you as a user.

With the included C3000 controller, new levels of accuracy can be achieved with the FlexAFM scan head.

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A multifunctional tool for single-cell biology, tissue engineering, nanopatterning and nanolithography

Fluid force microscopy combines the unique possibilities of nanofluidics with the positional accuracy and force sensitivity of the Nanosurf FlexAFM atomic force microscope to provide a whole new level of control and application possibilities in single-cell biology and beyond. FluidFM is an exclusive add-on product to the Nanosurf FlexAFM.

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The WITec atomic force microscope (AFM) alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope which provides superior optical access, easy cantilever alignment and high-resolution sample survey.

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The well-established Raman-atomic force microscope (AFM) combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument configurations. The alpha300 RA incorporates the features of the Raman microscopy system alpha300 R for powerful chemical imaging along with features of the atomic force microscopy system (alpha300 A) for high-resolution nanoscale surface characterization and thus facilitates a comprehensive understanding of the samples.

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The unprecedented all-in-one alpha300 RAS combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging techniques, simultaneous Raman-AFM analysis, TERS, and Nearfield-Raman (Raman-SNOM) imaging can be easily performed.

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