CCD cameras for direct detection (<20 keV)

iKon SO and Newton SO from Andor Technology

Besides their standard use as imaging devices CCD sensors are also suitable for the direct detection of VUV, EUV light and soft X-rays. For this purpose we offer back illuminated CCD sensors without coatings and micro lens arrays. Deep thermoelectric cooling and good linearity and homogeneity allow to detect even the weakest signals over long exposure times.

Back illuminated CCDs without AR coating
13 µm, 13.5 µm, 15 µm and 26 µm pixel size
Thermo-electrical cooling down to -100 °C for negligible dark current
High quality 16- and 18 bit AD converter for low readout noise
Flanges compatible with any vacuum port

We offer vacuum compatible CCD detectors with various sensor formats. Detection of VUV, EUV light and soft X-rays occurs by direct absorption of photons in the depletion layer of a pixel. Depending on the energy of the photon a number of electron-hole pairs is created. Excellent linearity and homogeneity ensures the quality of measurement data. CF or other type of vacuum flanges can be offered upon request. Andor X-ray cameras are used in many research labs for high energy physics around the world.

Higher harmonic generation
Soft X-rays
VUV and EUV spectroscopy
Synchrotron radiation
X-ray tomography
Soft x-ray microscopy using a table-top laser-induced plasma source based on a pulsed gas jetM. Müller,
K. Mann
Laser-Laboratorium Göttingen e.V.,
Optics / Short Wavelengths
2017iKon-L SO DO936N-OW-BN
A new compact soft X-ray spectrometer for RIXS studies at PETRA IIIZ. Yin1,2,
S. Techert1,2,3
1 FS-SCS, Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany
2 Structural Dynamics of (Bio)chemical Systems, Max Planck Institute for Biophysical Chemistry, Göttingen, Germany
3 Institute of X-ray Physics, Georg-August University, Göttingen, Germany
2017 iKon-L DO936N-OZ-BN
High-harmonic radiation for seeding the swiss free electron laseJ. Rauschenberger1, C. Hauri21H+P SPECTROSCOPY,
Dr. Hoerlein +
Partner GbR,
Mannheim, Germany, 2Paul Scherrer Institut,
Villigen, Switzerland
2016Newton DO940P-BN
Investigation of spin dynamics in Ni-Pd alloys
using extreme ultraviolet radiation
S. Gang,
R. Adam,
M. Plötzing,
C. M. Schneider
Peter Grünberg Institut (PGI-6), Forschungszentrum Jülich GmbH, JARA, Jülich, Germany2016Newton SO DO920P-BEN
Tabletop coherent diffractive imaging with a gas-discharge extreme ultraviolet light sourceL. Juschkin1,2,
J. Bußmann1,2,
L. Loetgering1,
D. Rudolf1,2, S. Brose3,
S. Danylyuk3,
R. Xu4,
J. Miao4
1Experimental Physics of EUV, RWTH Aachen University, JARA-FIT, Aachen, Germany
2Peter Grünberg Institut (PGI-9), Forschungszentrum Jülich GmbH, JARA-FIT, Jülich, Germany
3Chair for Technology of Optical Systems, RWTH Aachen University, JARA-FIT, Aachen, Germany
4Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, USA
2014iKon-M SO DO934P-BN
Small angle scattering using XUV light from high-order harmonic generationCh. Weier,
R. Adam,
C. M. Schneider
Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany2014Newton SO DO920P-BN
Lensless coherence diffraction imaging with an ultra- narrowband laser-based extreme-ultraviolet sourceS. Witte,
V. T. Tenner,
D. W. E. Noom,
K. S. E. Eikema
Institute for Lasers, Life and Biophotonics (LaserLaB), VU University Amsterdam, The Netherlands2014iKon-M SO DO934P-BN
Coherent X-ray scattering experiments at the coherence beamline P10 at PETRA IIIL. Müller,
F. Westermeier,
M. Sprung
Coherent X-Ray Scattering, DESY, Hamburg, Germany2013iKon-L SO DO936N-MW-BR-DD
Quantitative X-Ray phase imaging of impact damaged carbon-fiber-reinforced polymersM. Hildebrand, M. Leck,
M. Korth
Department of Analytical Measurement Technology, University of Applied Sciences and Arts, Göttingen, Germany2013iKon-M SO DO934P-BR-DD
Spatial characterization of a discharge based radiationK. Bergmann,
J. Vieker
Fraunhofer Institute for Laser Technology, Aachen, Germany
iKon-M SO DO934P-BN
Compact soft x-ray spectrometer for laser-matter studiesR. IrsigInstitute of Physics, University of Rostock, Germany2012
Newton SO DO940P-BN
Warm dense matter analysisP. Neumayer,
D. Hochhaus et al.

GSI, Darmstadt, Germany


iKon-M SO DO934P-BN
XUV Interferometry using thin-film beam splitters
U. Zastrau1,
V. Hilbert1,
M. Wünsche1,
S. Zhang1,
C. Rödel1,2,
E. Förster 2
1Institute of Optics and Quantum Electronics, University of Jena, Germany
2Helmholtz Institute Jena, Germany

iKon-L SO DO936N-MZ-BN
Element-selective ultrafast magnetization dynamicsD. Rudolf1,
Chan La-O-Vorakiat2,
E. Turgut2,
P. Grychtol1,4,
R. Adam1,
S. Mathias4,
J. M. Shaw3,
H. T. Nembach3,
T. J. Silva 3,
M. Aeschlimann4,
C. M. Schneider1,
M. M. Murnane2,
H. C. Kapteyn2
1Peter Grünberg Institute (PGI-6), Forschungszentrum Jülich, Germany
2Department of Physics and JILA, University of Colorado, Boulder, USA
3Electromagnetics Division, National Institute of Standards and Technology, Boulder, USA
4University of Kaiserslautern and Research Center OPTIMAS, Kaiserslautern, Germany

iKon-L SO DO936N-MW-BN
Time-resolved resonant soft x-ray scattering
with free-electron lasers
W. Schlotter1,
F. Sorgenfrei2,
M. Beye3,
W. Wurth2
1Stanford Linear Accelerator Center, Menlo Park, USA
2Institute for Experimental Physics and Center for Free-Electron Laser Science, University of Hamburg, Germany
3  Helmholtz Centre for Materials and Energy, Berlin, Germany
2011iKon-L SO DO936N-MW-BN
Table-top coherent x-ray-source from mid-infrared high power laser interaction with gasesT. Popmintchev1,
M.-C. Chen1,
D. Popmintchev1,
S. Ališauskas2,
G. Andriukaitis2,
T. Balčiūnas2,
A. Pugžlys2,
A. Baltuška2,
M. Murnane1,
H. Kapteyn1
1  JILA, University of Colorado, Boulder, USA
2  Photonics Institute, Vienna University of Technology, Austria
Newton SO DO920N-BN

Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates
M. Ibek,
T. Leitner,
P. Wernet,
A. Firsov,
A. Erko
Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany
iKon-L SO DO936N-MW-BN
Sample analysis with a grazing incidence XUV reflectometerS. Brose,
M. Banyay,
L. Juschkin,
S. Danylyuk

Chair for the Technology of Optical Systems, RWTH Aachen, Germany
Single event spectroscopy on laser generated x-ray beams
C. Kern,
M. Schnell,
C. Spielmann
Institute of Optics and Quantum Electronics, University of Jena, Germany2010iKon-L SO DO936N-MW-BN
Interferometry in the XUV spectral range using laser- generated high-order harmonicsD. Hemmers,
G. Pretzler
Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe,  and Institute of Applied Physical Chemistry, University of Heidelberg, Germany2010iKon-L SO DO936N-MW-BN
Coherent microscopy with soft X-raysR. Heine,
A. Rosenhahn
Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe,  and Institute of Applied Physical Chemistry, University of Heidelberg, Germany

Spectral and spatial characterization of harmonics in the XUV region

S. Eyring,
C. Kern,
J. Lohbreier,
R. Spitzenpfeil,
C. Spielmann

Institute of Optics and Quantum Electronics, University of Jena, Germany

A calibrated compact soft X-Ray spectrometer
H. Stiel,
H. Legall
Max Born Institute of Nonlinear Optics and Ultrafast Spectroscopy, Berlin, Germany2009iDus SO DO420A-BN3
Time resolved X-Ray diffractionI. UschmannInstitute of Optics and Quantumelectronics, University of Jena, Germany2007DX420-BR-DD2

Laserartige  XUV-Strahlung:
Charakterisierung und Handhabung von Gasharmonischen
A. Klein,
D. Hemmers,
G. Pretzler
Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany2006DO420-BN1

DO420 replaced by Newton SO 920
not available any more
iDus SO replaced by Newton SO


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