TEM (Transmission Electron Microscopes)

There are several TEM/STEMs of different accelerating voltages and proper model is used based on
the sample composition. 300kV/200kV models with superior resolution and penetrating power are
used for inorganic materials such as metals and ceramics while 120kV model with higher contrast is
used for polymers and biological tissues. When advanced analytical performances such as nano area
analysis and atomic-resolution analysis are required, FE electron source and spherical aberration
corrector are powerful options.

Features
0.078 nm spatial resolution for the highest performance aberration-corrected TEM/STEM models;
Simultaneous secondary electron imaging and STEM imaging reveal surface and bulk structures at the same time;
Unique analytical capabilities with the newly introduced spatially resolved EELS and the high-sensitivity EDS detectors.

Contacts

Request further information
Product Manager
+39 06 5004204
Fax: +39 06 5010389

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